보유장비 리스트

이름	모델	장비이용의뢰서/예약하기
4point-probe | 표면 저항 측정기 / CMT2000N Song-Hee Lee 052-217-4190 lychle2@unist.ac.kr Equipment location : 108동 B101호 (Bldg.108, Room B101)	Request of Analysis Reservation
AFM | 원자힘 현미경 / Park NX20 Hae-ra Kang 052-217-4167 haera@unist.ac.kr Equipment location : UNIST 108동 B101호	Request of Analysis Reservation
Cryogenic Probe Station | 극저온탐침측정기 / CRX-4K Eun Jeong Hwang 052-217-4192 hej9204@unist.ac.kr Equipment location : 108동 B104호(Bldg.108, Room B104)	Request of Analysis Reservation
Ellipsometer | 박막 두께 측정기 / Elli-SE-UaM8 Bo-seong Kim 052-217-4191 mbosing@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Inspection Microscope | 반도체 검사용 현미경 / DM 4000M Min-jae Kim 052-217-4064 mjkim@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Measurement Microscope | 측정용 현미경 / Axio Scope A1 Min-jae Kim 052-217-4064 mjkim@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Normal SEM | 주사전자현미경 / S-3400N(Type Ⅱ) Seon Jin Lee 052-217-4193 sunee6210@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Optical Surface Profiler (비접촉식 표면 및 단차 측정기기) | Optical Surface Profiler (비접촉식 표면 및 단차 측정기기) / MicroXAM-800 Seon Jin Lee 052-217-4193 sunee6210@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Surface profiler | 박막 단차 측정기 / P6 Seonjin Lee 052-217-4193 sunee6210@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation
Thickness measurement | 박막 두께 측정기 / ST4000-DLX Song-Hee Lee 052-217-4190 lychle2@unist.ac.kr Equipment location : 108동 B101호 (Bldg. 108, Room B101)	Request of Analysis Reservation