Equipment

Inspection Microscope | 반도체 검사용 현미경

보유장비 관련 정보
Laboratory/Field
Model DM 4000M
Maker LEICA Microsystems
Technician Min-jae Kim
Contact 052-217-4064 / mjkim@unist.ac.kr
Status for Reservation 가능
Reservation Unit 30min Maximum Time (per day) 1hr
Open(~ago) 2주전 Cancel (~ago) 2hr
  • Description

    Versatile functionality and analysis is only of use if high-quality original images can be obtained. The Digital Microscope has succeeded in producing sharper, super high resolution observation images by applying sophisticated technologies to every process from lighting to image generation.

  • Specifications

    • 6-position nosepiece (M32), manual

    • 4-position turret for filter cubes

    • Field of view : 25 mm

    • Contrast methods RL : BF, DF, Pol, ICR, Fluo

    • Optional contrast methods TL : BF

    • Large samples up to 150 * 150 mm

    • Rotatable through 360 degree sample stage

    • Ultra-bright LED Illumination with high-power LED

    (Life time : 50,000 hours)

    • Magnification (Objective lens) : 2.5 x , 5 x, 10 x, 20 x, 50 x, 100 x

    • Magnification (Ocular) : 10 x

  • Applications

    • Electric/Electronics device inspection

    • Image capture & measurement