Inspection Microscope | 반도체 검사용 현미경
| Laboratory/Field | |||
|---|---|---|---|
| Model | DM 4000M | ||
| Maker | LEICA Microsystems | ||
| Technician | Min-jae Kim | ||
| Contact | 052-217-4064 / mjkim@unist.ac.kr | ||
| Status for Reservation | 가능 | ||
| Reservation Unit | 30min | Maximum Time (per day) | 1hr |
| Open(~ago) | 2주전 | Cancel (~ago) | 2hr |
| Equipment location | 108동 B101호 (Bldg. 108, Room B101) | ||
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Description
Versatile functionality and analysis is only of use if high-quality original images can be obtained. The Digital Microscope has succeeded in producing sharper, super high resolution observation images by applying sophisticated technologies to every process from lighting to image generation.
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Specifications
• 6-position nosepiece (M32), manual
• 4-position turret for filter cubes
• Field of view : 25 mm
• Contrast methods RL : BF, DF, Pol, ICR, Fluo
• Optional contrast methods TL : BF
• Large samples up to 150 * 150 mm
• Rotatable through 360 degree sample stage
• Ultra-bright LED Illumination with high-power LED
(Life time : 50,000 hours)
• Magnification (Objective lens) : 2.5 x , 5 x, 10 x, 20 x, 50 x, 100 x
• Magnification (Ocular) : 10 x
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Applications
• Electric/Electronics device inspection
• Image capture & measurement