Equipment

High Resolution XRD | 고분해능 X선 회절기

보유장비 관련 정보
Laboratory/Field
Model D8 DISCOVERY
Maker Bruker
Technician Sun-yi Lee
Contact 052-217-4023 / ssun295@unist.ac.kr
Status for Reservation 가능
Reservation Unit 0.5hr Maximum Time (per day) 2hr
Open(~ago) 5일전 Cancel (~ago) 2시간전
Address 울산시 울주군 언양읍 유니스트길 50, 102동 201-4호
  • Description

    X-ray diffraction is a non-destructive analytical technique which reveals information about the crystallographic structure, chemical composition, and physical properties of powder and thin films.

  • Specifications

    • X-ray source : Cu-closed x-ray tube

    • Focus : line focus

    • X-ray generator : single, 220 V, 3 kW

    • θ-2θ based goniometer

    • Angular range

    - θ : 0 ~ 360 °

    - 2θ : - 110 ° ~ 168 °more

  • Applications

    • Determination of lattice mismatch between film & substrate

    • Assumption of stress and strain

    • Determination of dislocation density and characterization of the film

    • Measurement of super-lattices in multilayered epitaxial structures

    • Determination of the thickness, roughness, and density of the film (XRR)