High Resolution XRD | 고분해능 X선 회절기
| Laboratory/Field | |||
|---|---|---|---|
| Model | D8 DISCOVERY | ||
| Maker | Bruker | ||
| Technician | Ji-hye Park | ||
| Contact | 052-217-4035 / sophia@unist.ac.kr | ||
| Status for Reservation | 가능 | ||
| Reservation Unit | 0.5hr | Maximum Time (per day) | 2hr |
| Open(~ago) | 5일전 | Cancel (~ago) | 2시간전 |
| Equipment location | 울산시 울주군 언양읍 유니스트길 50, 102동 B101-2호 | ||
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Description
X-ray diffraction is a non-destructive analytical technique which reveals information about the crystallographic structure, chemical composition, and physical properties of powder and thin films.
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Specifications
• X-ray source : Cu-closed x-ray tube
• Focus : line focus
• X-ray generator : single, 220 V, 3 kW
• θ-2θ based goniometer
• Angular range
- θ : 0 ~ 360 °
- 2θ : - 110 ° ~ 168 °more
- 2theta range : 8° ~120°
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Applications
• Determination of lattice mismatch between film & substrate
• Determination of dislocation density and characterization of the film
• Measurement of super-lattices in multilayered epitaxial structures
• Determination of the thickness, roughness, and density of the film (XRR)