CS-STEM | 수차보정 주사투과전자현미경

보유장비 관련 정보
Model JEM-ARM300F
Maker JEOL
Technician Jong Hoon Lee
Contact 052-217-4171 /
Status for Reservation 가능
Reservation Unit 0.5hr Maximum Time (per day) 4hr
Open(~ago) 5일전 Cancel (~ago) 2시간전
Equipment location 108동 B102호 (Bldg.108, Room B102)
  • Description

    TEM is used to analyze micro-structures of materials with high spatial resolution. The high voltage electron beam generated from electron gun is illuminated on thin film specimen. The beam penetrating the specimen passes through an array of magnetic lenses and forms a high resolution electron image of the electron diffraction pattern.

  • Specifications

    • Acceleration voltage : 60, 80, 160, 300 kV

    • HAADF-STEM resolution@300 kV : 0.058 nm

    • EDS resolution : 128 eV

    • EELS resolution : 0.3 eV

  • Applications

    • Sub angstrom spatial resolution TEM

    • Atomic resolution at low kV

    • Imaging and spectroscopy of soft matters

    • Dynamics of individual atoms

    • High energy resolution EELS and EDS

    • Energy-filtered imaging and diffraction