CS-STEM | 수차보정 주사투과전자현미경
| Laboratory/Field | |||
|---|---|---|---|
| Model | JEM-ARM300F | ||
| Maker | JEOL | ||
| Technician | Jong Hoon Lee | ||
| Contact | 052-217-4171 / jonghoon@unist.ac.kr | ||
| Status for Reservation | 가능 | ||
| Reservation Unit | 0.5hr | Maximum Time (per day) | 4hr |
| Open(~ago) | 5일전 | Cancel (~ago) | 2시간전 |
| Equipment location | 108동 B102호 (Bldg.108, Room B102) | ||
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Description
TEM is used to analyze micro-structures of materials with high spatial resolution. The high voltage electron beam generated from electron gun is illuminated on thin film specimen. The beam penetrating the specimen passes through an array of magnetic lenses and forms a high resolution electron image of the electron diffraction pattern.
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Specifications
• Acceleration voltage : 60, 80, 160, 300 kV
• HAADF-STEM resolution@300 kV : 0.058 nm
• EDS resolution : 128 eV
• EELS resolution : 0.3 eV
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Applications
• Sub angstrom spatial resolution TEM
• Atomic resolution at low kV
• Imaging and spectroscopy of soft matters
• Dynamics of individual atoms
• High energy resolution EELS and EDS
• Energy-filtered imaging and diffraction