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투과전자현미경3(TEM3)_Spectra 300 | 투과전자현미경3

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보유장비 관련 정보
Laboratory/Field
  • Materials Characterization Lab
  • Electron Microscopy
Model Spectra 300
Maker Thermofisher
Technician Ji Hyun Park
Contact 052-217-4177 / jihyun9067@unist.ac.kr
Status for Reservation 가능
Reservation Unit 0.5hr Maximum Time (per day) 2hr
Open(~ago) 5일전 Cancel (~ago) 2시간전
Equipment location 102동 B114호

  • Description

    TEM is used to analyze micro-structures of materials with high spatial resolution. The high voltage electron beam generated from electron gun is illuminated on thin film specimen. The beam penetrating the specimen passes through an array of magnetic lenses and forms a high resolution electron image of the electron diffraction pattern.

  • Specifications

    • Acceleration voltage : 80, 200, 300 kV

    • HAADF-STEM resolution@300 kV : 0.05 nm

    • EDS : Super-X(4-SDD(120mm^2))

  • Applications

    • Sub angstrom spatial resolution TEM

    • Atomic resolution at low kV

    • Imaging and spectroscopy of soft matters

    • Dynamics of individual atoms

    • High energy resolution EDS

    • Energy-filtered imaging and diffraction

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