Multimode V_AFM | 원자현미경
| Laboratory/Field | |||
|---|---|---|---|
| Model | MultiMode V | ||
| Maker | Veeco | ||
| Technician | Dong-ju Lim | ||
| Contact | 052-217-4032 / djlim@unist.ac.kr | ||
| Status for Reservation | 가능 | ||
| Reservation Unit | 0.5hr | Maximum Time (per day) | 2hr |
| Open(~ago) | 5일전 | Cancel (~ago) | 2시간전 |
| Equipment location | 울산광역시 울주군 언양읍 유니스트길 50, 102동 B113 | ||
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Description
<의뢰절차> 샘플보낼주소 : 울산시 울주군 언양읍 유니스트길 50 102동 203호
의뢰는 dimension AFM 장비로 하기 바랍니다.
https://ucrf.unist.ac.kr/kor/equipment-tracking/equipments/?stext=afm&cate1=&no=28031
샘플 보낼주소 : 울산광역시 울주군 언양읍 유니스트길 50, 102동 203호AFM or SPM is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen line by line and recording the probe-surface interaction as a function of position.
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Specifications
○ X-Y scan range 125μm x 125μm typical, 5μm minimum
○ Sample size 15mm diameter, 15mm thick
○ Vertical Noise Floor : 0.03nm
○ Microscope optics
● 5-megapixel digital camera;
● 400μm to 500μm viewing area;
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Applications
• Surface morphology
• Conductive AFM
• Nano indentor