High Resolution X-ray Diffractometer(HRXRD 2) | 고분해능 X-선 회절분석기
| Laboratory/Field | |||
|---|---|---|---|
| Model | SmartLab | ||
| Maker | RIGAKU | ||
| Technician | Gyeong Ae Lee | ||
| Contact | 052-217-4163 / kalee@unist.ac.kr | ||
| Status for Reservation | 가능 | ||
| Reservation Unit | 30분 | Maximum Time (per day) | |
| Open(~ago) | Cancel (~ago) | ||
| Equipment location | 울산광역시 울주군 언양읍 유니스트길 50 102동 B101-2호 | ||
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Description
○ 응용: 박막 결정구조 분석
○ 측정범위: 5~110 도
○ 샘플량: 박막 및 호일 1um 이하
○ 샘플준비
- 가로세로 1cm ~ 2cm 크기로 준비(윗면과 바닥 모두 이물질 없는 깨끗한 상태로 준비)
○ For self-use only -> Please request XRD analysis using HRPXRD
○ Application: Crystal structure analysis of thin film
○ Measurement range: 5~110 degrees
○ Sample amount: Thin film and foil 1um or less
○ Sample preparation
- Prepare in a size of 1cm to 2cm in width and length(Dust free) -
Specifications
○ X-ray generator
- Max. output : 9kW or more
- Max. voltage : 45kV or more
- Max. current : 200mA or more
- Source : Rotating anode Cu target
○ Goniometer
- Type : Theta-Theta vertical type
- Radius : 300mm or more
○ Multi-axes large cradle stage
- Theta/2theta : -3 to 162 deg or more
- 2theta/chi-axis(In-Plane) : 3 to 120 deg or more
- Chi-axis : -5 to +95 deg or more
- Phi-axis : -360 to +360 deg (unlimited) or more
- Z-axis : 2mm or more
- Max. sample size : 8 inch or more
○ Slit & Optics
- Incident & Receiving slit : Automatic variable slit
- Parabolic mirror optic : Parallel beam
○ Detector
- Type : Hybrid multi-channel semi-conductive detector
- Active area : 380mm²or more
- Strip size : 75μm or less
- Scan mode : 1D & 0D or more
○ Software & Utilities
- Standard functions
- Application functions
- Chiller & AVR, PC
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Applications