S-3400N Scanning Electron Microscope | 전자현미경
| 연구실/분야 | |||
|---|---|---|---|
| 모델명 | S-3400N(Type Ⅱ) | ||
| 제조사 | Hitach High-Technologies | ||
| 담당자 | 김민재 | ||
| 연락처 | 052-217-4064 / mjkim@unist.ac.kr | ||
| 예약 가능여부 | 가능 | ||
| 예약단위 | 1hr | 1일최대예약시간 | 1hr |
| 예약Open(~일 전) | 2주전 | 예약취소불가(~일 전) | 2hr |
| 장비위치 | 108동 B101호 (Bldg. 108, Room B101) | ||
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Description
SEM is a microscope that uses electrons instead of light to form an image. The scanning electron microscope has many advantages over traditional microscopes.
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Specifications
• Magnification : x 5 to x 300,000 (continuous)
• Accelerate voltage : 0.3 to 30 kV (0.1 kV/step)
• Detector : SE+BSE
• Electrical image shift : ± 50μm (WD = 10 mm)
• Electron gun : precentered cartridge filament
• Traverse : X axis 0 ~ 100 mm, Y axis 0 ~ 50 mm
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Applications
• Microstructure analysis of the sample, such as a wide range of metal, materials, semiconductors, fiber and polymer material.
• Surface microstructure of the metal, the material and shape of analysis.