보유장비

Inspection Microscope | 반도체 검사용 현미경

Inspection Microscope
보유장비 관련 정보
연구실/분야
모델명 DM 4000M
제조사 LEICA Microsystems
담당자 김민재
연락처 052-217-4064 / mjkim@unist.ac.kr
예약 가능여부 가능
예약단위 30min 1일최대예약시간 1hr
예약Open(~일 전) 2주전 예약취소불가(~일 전) 2hr
장비위치 108동 B101호 (Bldg. 108, Room B101)
  • Description

    Versatile functionality and analysis is only of use if high-quality original images can be obtained. The Digital Microscope has succeeded in producing sharper, super high resolution observation images by applying sophisticated technologies to every process from lighting to image generation.

  • Specifications

    • 6-position nosepiece (M32), manual

    • 4-position turret for filter cubes

    • Field of view : 25 mm

    • Contrast methods RL : BF, DF, Pol, ICR, Fluo

    • Optional contrast methods TL : BF

    • Large samples up to 150 * 150 mm

    • Rotatable through 360 degree sample stage

    • Ultra-bright LED Illumination with high-power LED

    (Life time : 50,000 hours)

    • Magnification (Objective lens) : 2.5 x , 5 x, 10 x, 20 x, 50 x, 100 x

    • Magnification (Ocular) : 10 x

  • Applications

    • Electric/Electronics device inspection

    • Image capture & measurement