보유장비

FE-TEM | 투과전자현미경

보유장비 관련 정보
연구실/분야
모델명 Tecnai G2 F20 X-Twin
제조사 FEI
담당자 임정환
연락처 052-217-4175 / jhwan0918@unist.ac.kr
예약 가능여부 가능
예약단위 0.5hr 1일최대예약시간 4hr
예약Open(~일 전) 5일전 예약취소불가(~일 전) 2시간전
장비위치 102동 B109호 (Bldg.102, Room B109)
  • Description

    TEM is used to analyze micro-structures of materials with high spatial resolution. The high voltage electron beam generated from electron gun is illuminated on thin film specimen. The beam penetrating the specimen passes through an array of magnetic lenses and forms a high resolution electron image of the electron diffraction pattern.

  • Specifications

    • Acceleration voltage: 200 kV

    • Point resolution: 0.25 nm

    • TEM Line resolution: 0.102 nm

    • Specimen tilting: X = ± 30 °, Y = ± 30 °

    • Image recording system: CCD

  • Applications

    • High resolution electron imaging

    • Diffraction pattern

    • STEM imaging (HAADF)

    • Energy dispersive spectroscopy (EDS)