Inspection Microscope | 반도체 검사용 현미경
| 연구실/분야 | |||
|---|---|---|---|
| 모델명 | DM 4000M | ||
| 제조사 | LEICA Microsystems | ||
| 담당자 | 김민재 | ||
| 연락처 | 052-217-4064 / mjkim@unist.ac.kr | ||
| 예약 가능여부 | 가능 | ||
| 예약단위 | 30min | 1일최대예약시간 | 1hr |
| 예약Open(~일 전) | 2주전 | 예약취소불가(~일 전) | 2hr |
| 장비위치 | 108동 B101호 (Bldg. 108, Room B101) | ||
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Description
Versatile functionality and analysis is only of use if high-quality original images can be obtained. The Digital Microscope has succeeded in producing sharper, super high resolution observation images by applying sophisticated technologies to every process from lighting to image generation.
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Specifications
• 6-position nosepiece (M32), manual
• 4-position turret for filter cubes
• Field of view : 25 mm
• Contrast methods RL : BF, DF, Pol, ICR, Fluo
• Optional contrast methods TL : BF
• Large samples up to 150 * 150 mm
• Rotatable through 360 degree sample stage
• Ultra-bright LED Illumination with high-power LED
(Life time : 50,000 hours)
• Magnification (Objective lens) : 2.5 x , 5 x, 10 x, 20 x, 50 x, 100 x
• Magnification (Ocular) : 10 x
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Applications
• Electric/Electronics device inspection
• Image capture & measurement