AFM-Raman
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Description
Raman information present to characterization of the molecular structure by scattered radiation of different wavelengths. The energy change (either lost or gained) of Raman depends on the symmetry of the molecule. It is possible to obtain confocal Raman microscopy combined AFM.
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Specifications
• Laser wavelength : 532 nm/ 633 nm/ 785 nm
• Lens magnification : 100 x, 50 x, 20 x
• Confocal raman (single, line, and image scan)
• Scanning near-field optical microscope (SNOM)
• AFM mode (Acoustic AC and contact mode)
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Applications
• Measurement of surface topography (AFM mode)
• Measurement of raman image & single spectrum (Raman mode)