보유장비

Advanced TEM | 수차보정 고분해능 투과전자현미경

Advanced TEM
보유장비 관련 정보
연구실/분야
모델명 Titan G2(60-300)
제조사 FEI
담당자 김영기
연락처 052-217-4033 / cclock95@unist.ac.kr
예약 가능여부 가능
예약단위 0.5hr 1일최대예약시간 12hr
예약Open(~일 전) 5일전 예약취소불가(~일 전) 2시간전
  • Description

    TEM is used to analyze micro-structures of materials with high spatial resolution. The high voltage electron beam generated from electron gun is illuminated on thin film specimen. The beam penetrating the specimen passes through an array of magnetic lenses and forms a high resolution electron image of the electron diffraction pattern.

  • Specifications

    • Acceleration voltage : 60 - 300 kV

    • Lattice resolution : 0.065 nm

    • BF-STEM resolution : 0.14 nm

    • HAADF-STEM resolution : 0.12 nm

    • Probe stability : 1 nm/min or less

    • Stage stability : 1 nm/min or less

    • EDS resolution : 128 eV

    • EELS resolution : 0.16 eV

    • Contamination : 1 nm/min or less

  • Applications

    • Sub angstrom spatial resolution TEM

    • Atomic resolution at low kV

    • Imaging and spectroscopy of soft matters

    • Dynamics of individual atoms

    • High energy resolution EELS and EDS

    • Energy-filtered imaging and diffraction