Equipment

보유장비 리스트
이름 모델 장비이용의뢰서/예약하기

4point-probe | 표면 저항 측정기 / CMT2000N

Seon Jin Lee 052-217-4193 [email protected]
Equipment location : 108동 B101호 (Bldg.108, Room B101)

AFM | 원자힘 현미경 / Park NX20

Hae-ra Kang 052-217-4167 [email protected]
Equipment location : UNIST 108동 B101호

Cryogenic Probe Station | 극저온탐침측정기 / CRX-4K

Eun Jeong Hwang 052-217-4192 [email protected]
Equipment location : 108동 B104호(Bldg.108, Room B104)

Ellipsometer | 박막 두께 측정기 / Elli-SE-UaM8

Goh Myeong Bae 052-217-4189 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Inspection Microscope | 반도체 검사용 현미경 / DM 4000M

Min-jae Kim 052-217-4064 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Measurement Microscope | 측정용 현미경 / Axio Scope A1

Min-jae Kim 052-217-4064 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Normal SEM | 주사전자현미경 / S-3400N(Type Ⅱ)

Kang O Kim 052-217-4182 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Optical Surface Profiler (비접촉식 표면 및 단차 측정기기) | Optical Surface Profiler (비접촉식 표면 및 단차 측정기기) / MicroXAM-800

Seon Jin Lee 052-217-4193 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Surface profiler | 박막 단차 측정기 / P6

Seonjin Lee 052-217-4193 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)

Thickness measurement | 박막 두께 측정기 / ST4000-DLX

Seon Jin Lee 052-217-4193 [email protected]
Equipment location : 108동 B101호 (Bldg. 108, Room B101)