보유장비

Normal SEM | 주사전자현미경

Normal SEM
보유장비 관련 정보
연구실/분야
모델명 S-3400N(Type Ⅱ)
제조사 Hitach High-Technologies
담당자 이루다
연락처 052-217-4022 / luda30159@unist.ac.kr
예약 가능여부 가능
예약단위 1hr 1일최대예약시간 1hr
예약Open(~일 전) 2주전 예약취소불가(~일 전) 2hr
  • Description

    SEM is a microscope that uses electrons instead of light to form an image. The scanning electron microscope has many advantages over traditional microscopes.

  • Specifications

    • Magnification : x 5 to x 300,000 (continuous)

    • Accelerate voltage : 0.3 to 30 kV (0.1 kV/step)

    • Detector : SE+BSE

    • Electrical image shift : ± 50μm (WD = 10 mm)

    • Electron gun : precentered cartridge filament

    • Traverse : X axis 0 ~ 100 mm, Y axis 0 ~ 50 mm

  • Applications

    • Microstructure analysis of the sample, such as a wide range of metal, materials, semiconductors, fiber and polymer material.

    • Surface microstructure of the metal, the material and shape of analysis.