Nano Mill | 초저전압 이온 밀링
| Laboratory/Field | |||
|---|---|---|---|
| Model | Model 1040 | ||
| Maker | E.A. Fischione Instruments, Inc. | ||
| Technician | Gyeong Ae Lee | ||
| Contact | 052-217-4163 / kalee@unist.ac.kr | ||
| Status for Reservation | 불가능 | ||
| Reservation Unit | 0.5hr | Maximum Time (per day) | 12hr |
| Open(~ago) | 5일전 | Cancel (~ago) | 2시간전 |
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Description
Revolutionary ultra-low-energy, inert gas, concentrated ion beam produces specimens free amorphous and implanted layers.
Ideal for post-FIB processing. -
Specifications
•Acceleration voltage : 50~2000 V
•Beam current density : up to 1 mA/cm²
•Beam diameter : 2 microns
•Milling angle : 0 ° to +-10 °
•Stage temperature : to -175 °C
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Applications
TEM specimen preparation system