Nano230 FE-SEM | 전계방출형주사전자현미경

보유장비 관련 정보
Model Nova NanoSEM
Maker FEI
Technician Gyeong Ae Lee
Contact 052-217-4163 /
Status for Reservation 가능
Reservation Unit 0.5hr Maximum Time (per day) 2hr
Open(~ago) 5일전 Cancel (~ago) 2시간전
Equipment location 102동 B114호(Bldg.102, Room B114)
  • Description

    SEM is a microscope that uses electrons instead of light to form an image. The SEM uses electromagnets rather than lenses, the researcher has much more control in the degree of magnification. Field-emission scanning electron microscope provides ultra high resolution image down to 1 nm resolution thanks to the inherent brightness of field–emission electron gun.

  • Specifications

    • Electron gun

    : Schottky type thermal FE gun

    • Resolution

    - < 1.0 nm @15 kV

    - < 1.6 nm @1 kV

    • Probe current : 0.6 pA ~ 100 nA

    • Reduced charge & contamination operation

  • Applications

    • Secondary electron image

    • Backscattered electron image

    • Energy dispersive X-ray analysis EDS

    • X-ray elemental mapping

    • Nano-particles characterization

    • Magnetic materials characterization